作者: David William Sesko , Michael Nahum
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摘要: A chromatic point sensor system configured to compensate for potential errors due workpiece material effects comprises a first confocal optical path including longitudinally dispersive element focus different wavelengths at distances proximate workpiece; second substantially the same distance light source connected path; disabling element; and CPS electronics comprising wavelength detector which provides output spectral profile data. The data from is usable distance-independent component that includes effects.