Cross-correlation image tracking for drift correction and adsorbate analysis
作者： B. A. Mantooth , Z. J. Donhauser , K. F. Kelly , P. S. Weiss
DOI: 10.1063/1.1427417
关键词:
摘要: A digital image tracking algorithm based on Fourier-transform cross-correlation has been developed to correct for instrumental drift in scanning tunneling microscope images. technique was eliminate cumulative errors associated with fractional pixel drift. This used monitor conductance changes different conformations conjugated molecular switch molecules and trace the diffusion of individual benzene Ag{110}. Molecular motions have tracked up 25 h (400 images) acquisition time.
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sci-hub.se 参考文章(32)
G. Tziritas, C. Labit, Motion Analysis for Image Sequence Coding Elsevier Science Inc.. ,(1994)
Alan C. Bovik, Handbook of Image and Video Processing ,(2000)
John C. Russ, The Image Processing Handbook ,(1992)
Alan V. Oppenheim, Ronald W. Schafer, Discrete-Time Signal Processing ,(1989)
J. Römer, M. Plaschke, J.I. Kim, Alignment of AFM images using an iterative mathematical procedure Ultramicroscopy. ,vol. 85, pp. 99- 105 ,(2000) , 10.1016/S0304-3991(00)00044-9
Qingxiong Zheng, Joseph C Klewicki, A fast data reduction algorithm for molecular tagging velocimetry: the decoupled spatial correlation technique Measurement Science and Technology. ,vol. 11, pp. 1282- 1288 ,(2000) , 10.1088/0957-0233/11/9/305
Masato Aketagawa, Koji Takada, Yoshihisa Minao, Yuki Oka, Jong-Doo Lee, Tracking and stepping control of the tip position of a scanning tunneling microscope by referring to atomic points and arrays on a regular crystalline surface Review of Scientific Instruments. ,vol. 70, pp. 2053- 2059 ,(1999) , 10.1063/1.1149710
H.-P. Rust, J. Buisset, E. K. Schweizer, L. Cramer, High precision mechanical approach mechanism for a low temperature scanning tunneling microscope Review of Scientific Instruments. ,vol. 68, pp. 129- 132 ,(1997) , 10.1063/1.1147846
M. A. Reed, J. Chen, A. M. Rawlett, D. W. Price, J. M. Tour, Molecular random access memory cell Applied Physics Letters. ,vol. 78, pp. 3735- 3737 ,(2001) , 10.1063/1.1377042
B. S. Swartzentruber, Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy Physical Review Letters. ,vol. 76, pp. 459- 462 ,(1996) , 10.1103/PHYSREVLETT.76.459