Masking defective bits in a storage array
作者： Hari Kannan , John Hayes , Nenad Miladinovic , John D Davis , Tan Zhangxi
DOI:
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摘要: A method of failure mapping is provided, including distributing user data throughout a plurality storage nodes through erasure coding. The are housed within chassis that couples the as cluster. Each has non-volatile solid-state with flash memory or other types memory. accessible via coding from remainder in event two being unreachable. includes determining block defect, generating mask indicates and reading application mask. performed by storage.
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