An x‐ray photoelectron spectroscopy investigation of the incorporation of surface oxides into bulk zirconium

摘要: X‐ray photoelectron spectroscopy (XPS) and ion scattering have been used to investigate the mechanism by which a thin ZrO2 film formed at surface of polycrystalline zirconium dissolves into bulk 400 °C under nonoxidizing conditions. In addition ZrO2, suboxide is directly observed in XPS spectra taken after oxidation. On heating oxidized Zr intensity both 3d5/2 associated with O 1s decay linearly time. A concomitant linear increase summed intensities band metal ZrxO. model proposed explain these observations involves oxygen transport from interface where formation intermediate appears be rate‐controlling step. The postulated this temperature ZrxO x>1.