作者: Ismail Lyly Nyl , Mohd Wahid , Mohamad Hafiz , Zulkefle Habibah , Sukreen Hana Herman
DOI: 10.4028/WWW.SCIENTIFIC.NET/AMR.576.582
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摘要: This paper reports on the dielectric properties of multilayer PVDF-TrFE/PMMA:TiO2 thin film. Two samples were fabricated ITO substrates; one with PVDF-TrFE only and another PMMA:TiO2 (PVDF-TrFE/PMMA:TiO2). Both produced by spin coating method. Dielectric characterized using impedance spectroscopic. constant, k, capacitance loss, tan δ values PMMA:TiO2/PVDF-TrFE measured in frequency range 0 – 50 kHz. The result for loss did not show any significant different between without nanocomposite layer. However, constant are affected when depositing a layer PMMA:TiO2. is decreased 0.3 from 7.9 to 7.6.