The Effects of Thermal Annealing on ZnO Thin Films Produced by Spin-Coating Method on Quartz Substrates

摘要: In this work, zinc oxide (ZnO) thin films on quartz substrates were fabricated using the spin-coating method. Thermal annealings from $$350\,^{\circ }\hbox {C}$$ to $$1050\,^{\circ have been performed in $$50\,^{\circ increments and for two annealing durations (0.5 h 8 h). X-ray diffraction (XRD) spectra, scanning electron microscopy micrographs, UV–Vis absorption spectra of all samples elucidated mechanical optical points view. It has observed that temperatures, crystal phase obtained. After $$850\,^{\circ annealings, a new related $$\hbox {Zn}_{2}\hbox {SiO}_{4}$$ (willemite) also appeared XRD spectra. This remained stable up together with ZnO phase. found nano/micro rod diameters crystals reach maximum $$(0.4\,\upmu \hbox {m})$$ at $$700\,^{\circ both durations. For $$650\,^{\circ nanorods be split into homogeneous length $$500\,\upmu {m}$$ width $$0.35\,\upmu (350 nm) which was not case other temperatures. $$950\,^{\circ rods started disappear formed films.