Method and apparatus for surface treating of substrates

作者: Masato Tanaka , Hisao Nishizawa , Masaru Morita

DOI:

关键词:

摘要: A method for surface treating of thin substrates such as semiconductor wafers, wherein a wafer formed with deep and minute trenches on its is horizontally placed spinner in chamber trenched directed up, then ultraviolet light emitted to the dissolve impurities sticking trenches, thereafter etchant spouted from nozzle being spinned about vertical axis at high speed, next inside rendered lower pressure than atmospheric recovered after lapse predetermined time, thus series these steps supplying, reducing, recovering are carried out until complete entrance into interior surfaces effected, so even or smooth surfaces, finally treated rinsing, heating drying.

参考文章(11)
William L. Olsen, Linnea J. Shaver, Janice J. Kelemen, John O. Freeborn, Method and apparatus for sonicating articles ,(1983)
John D. Cuthbert, Nicholas A. Soos, Removal of coating from periphery of a semiconductor wafer ,(1983)
H. Keith Willcox, Charles M. McKenna, Photon enhanced reactive ion etching ,(1978)
Joel A. Elftmann, Robert S. Blackwood, Substrate stripping and cleaning apparatus ,(1975)
H. Hiraoka, J. Pacansky, UV hardening of photo‐ and electron beam resist patterns Journal of Vacuum Science and Technology. ,vol. 19, pp. 1132- 1135 ,(1981) , 10.1116/1.571183
Kazuhiro Tanaka, Sueo Hamamoto, Washing and drying apparatus for photomask ,(1979)
Shirakawa Shiyuuichi, SEMICONDUCTOR WAFER WASHING APPARATUS ,(1985)