Imaging conditions for reliable measurement of displacement and strain in high-resolution electron microscopy
作者： M.J. Hÿtch , T. Plamann
DOI: 10.1016/S0304-3991(00)00099-1
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摘要: … For linear interference, the influence of the objective lens on the measurement of displacement fields is characterised by the gradient of the effective transfer, including damping terms, at …
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