作者: R.F. Orsagh , D.W. Brown , P.W. Kalgren , C.S. Byington , A.J. Hess
DOI: 10.1109/AERO.2006.1656086
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摘要: … failure tests on both systems are used to illustrate the approach and demonstrate its effectiveness in predicting … One of the primary failure modes in analog circuits occurs within metal-…