Piezoelectric, dielectric, and interfacial properties of aluminum nitride films

作者: D. Liufu , K. C. Kao

DOI: 10.1116/1.581352

关键词:

摘要: The piezoelectric and related properties of highly c-axis oriented AlN films fabricated by dc planar magnetron sputtering have been measured. Experimental results show that can be at low electric fields with energetic electrons driven out a magnetic field to reduce any possible damaging effects resulting from electron bombardments on the growing films, strong microwave effect. A bulk acoustic wave delay line formed depositing an film as transducer z-LiNbO3 substrate propagation medium exhibits good performances. major advantage such is its weight volume made much smaller than conventional lines. also chemical dielectric properties, suitable for use insulation or passivation layers.

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