作者: Dipankar Mandal , Klaus Müller , Karsten Henkel , Dieter Schmeißer
DOI: 10.1016/J.APSUSC.2012.07.144
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摘要: Abstract The impact of prolonged X-ray irradiation during photoelectron spectroscopy (XPS) measurement was investigated on poly(vinylidene-trifluoroethylene) (P(VDF-TrFE)) thin films. It observed that can accelerate the crosslinking P(VDF-TrFE) and diminish ferroelectric phase. Fourier transform infrared (FT-IR) data indicate phase diminishes completely after 360 kJ dose it induces paraelectric In this work, main emphasis given to optimization XPS measurements maintain within copolymer