作者: K Prabakar , S Venkatachalam , Y.L Jeyachandran , Sa.K Narayandass , D Mangalaraj
DOI: 10.1016/J.MSEB.2003.10.017
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摘要: Abstract We report the structural, Raman and optical properties of Cd0.6Zn0.4Te polycrystalline thin films deposited onto well cleaned corning glass substrates by vacuum evaporation. X-ray diffraction pattern showed that incorporation zinc favours growth preferentially oriented parallel to (1 1 1) planes cubic CdTe. The response evaporated in 1.5–5.5 eV photon energy range at room temperature has been studied spectroscopic ellipsometry. measured dielectric-function spectra reveal distinct structures energies E1 (3.53 eV), E1+Δ1 (3.9 eV) E2 (5 eV) critical points corresponding interband transitions. In order check film local atomic order, samples were spectroscopy. transverse longitudinal optic modes regularly found CdTe ZnTe also observed films. From transmittance absorption coefficient, band gaps are be direct allowed.