作者: Ernest Hasselbrink , Mike Anderson , Zoe Defreitas , Mark Mikofski , Yu-Chen Shen
DOI: 10.1109/PVSC.2013.6744087
关键词:
摘要: Establishing a strong basis for confidence in solar technology requires being able to prove low-degradation track record the real world, and rationalize it with physical understanding investigation. This paper briefly reviews our previously-published model calculating degradation reliability, PVLife, which computes hour-by-hour of PV modules using weather files sub-models developed from accelerated test data. We then demonstrate validation this against large statistical data set obtained 266 systems powered by SunPower (data over 179 installed Powerlight, non-SunPower are also shown). In total these represent 800,000 3.2 million module-years experience. The analysis technique little manual processing can be derived live sites without special experimental treatment. discuss returnrate on incorporating SunPower's back-contact cell, as well front contact fleet. Implications failure prediction discussed.