作者: Nikola Pascher , Dominik Bischoff , Thomas Ihn , Klaus Ensslin
DOI: 10.1063/1.4742862
关键词:
摘要: The metallic tip of a scanning probe microscope operated at temperature 1.7 K is used to locally induce potential in graphene nanoribbon. Images the conductance through device as function tip-position show that two centers enhanced are formed inside structure. By applying linescan-technique, it can be demonstrated these features correspond charge localizations, exhibiting characteristics quantum dots. Scanning gate microscopy allows us characterize them with high resolution both real space and energy.