作者: P.A. Bernard , J.M. Gautray
DOI: 10.1109/22.75310
关键词:
摘要: An approach for measuring the permittivity of dielectric materials by means a microstrip ring resonator is presented. The method used in conjunction with variational calculation line capacitance multilayer microstriplike transmission to compute effective and hence resonant frequency ring. results are compared measurements made X-band waveguide cavity-by-cavity perturbation techniques tend confirm that resonators can be measurements. However, having large constant, comparative seem diverge rapidly. >