作者: Frank L. Pasquale , Ishtak Karim , Adrien Lavoie , Purushottam Kumar , Jun Qian
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摘要: Methods and apparatuses for depositing films in high aspect ratio features trenches using a post-dose treatment operation during atomic layer deposition are provided. Post-dose operations performed after adsorbing precursors onto the substrate to remove adsorbed at tops of prior converting silicon-containing film. treatments include exposure non-oxidizing gas, plasma, ultraviolet radiation.