Compressional residual stress in Bastogne boudins revealed by synchrotron X‐ray microdiffraction

作者: Kai Chen , Martin Kunz , Yao Li , Eloisa Zepeda-Alarcon , Manuel Sintubin

DOI: 10.1002/2016GL069236

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摘要: Lattice distortions in crystals can be mapped at the micron scale using synchrotron X-ray Laue microdiffraction (μXRD). From lattice shape and orientation of elastic strain tensor derived interpreted terms residual stress. Here we apply new method to vein quartz from original boudinage locality Bastogne, Belgium. A long-standing debate surrounds kinematics Bastogne boudins. The μXRD measurements reveal a shortening strain, perpendicular wall, corroborating model that boudins formed by layer-parallel not extension, as is geological community generally inferred process boudinage.

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