作者: J.G. Cook , M.P. van der Meer
DOI: 10.1016/0040-6090(86)90409-8
关键词:
摘要: Abstract Films of cobalt oxide were prepared by r.f. reactive sputtering a target in Ar-O2 mixtures, and their optical properties determined absorption spectroscopy scanning ellipsometry. The films further characterized electron microscopy X-ray diffraction. found to consist Co3O4 when the oxygen flow rate exceeded critical value, agreement with previous studies. this are due intense ligand field Co2+ Co3+ ions spinel structure. oxidized near 500 °C very similar those sputtered films. Reactive co-sputtering nickel blackened for low Ni:Co ratios as result charge transfer absorption. Smooth did not function well selective thermal absorbers solar radiation.