作者: Z. GoŁacki , K. Godwod , J. Majewski , G. JasioŁek
DOI: 10.1016/0022-0248(87)90275-2
关键词:
摘要: X-ray diffraction measurements and electron microprobe analysis were performed on the PbTe crystals grown by Bridgman method doped with 1.2 wt% Cr. The scanning microscopic observations carried out (110) oriented samples revealed needle-like precipitates enriched in chromium tellurium. It was confirmed that composition of widest equal to Cr3Te4. corresponded mixing two compounds: Cr2Te3 CrTe. Using measurements, additional phases such as CrTe monoclinic, hexagonal have been found investigated samples.