Guided-wave reflectometry with micrometer resolution.

摘要: We describe a new type of optical reflectometry which is useful in testing single-mode lightguide systems. This technique uses scanning Michelson interferometer conjunction with broadband illuminating source and cross-correlation detection. High resolution achieved through the limited coherence backscattered radiation. With this approach it possible to distinguish scattering centers separated by only few micrometers. In some cases loss may be estimated for components transmission path test lightguide. The basic principles diagnostic technique, along performance characteristics, are illustrated an all-fiber reflectometer. also discuss several laboratory applications serve demonstrate capabilities measurement concept.