Quantitative microwave impedance microscopy with effective medium approximations

摘要: Microwave impedance microscopy (MIM) is a scanning probe technique to measure local changes in tip-sample admittance. The imaginary part of the reported change calibrated with finite element simulations and physical measurements standard capacitive sample, thereafter output ΔY given reference value siemens. Simulations also provide means extracting sample conductivity permittivity from admittance, procedure verified by comparing estimated polytetrafluoroethlyene (PTFE) accepted value. published others have investigated system for at conductivity, or conversely permittivity; here we supply full behavior multiple values both parameters. Finally, well-known effective medium approximation Bruggeman considered as estimating volume fractions constituents inhomogeneous two-phase systems. Specifically, consider estimation ...