Photoelectric study of β‐FeSi2 on silicon: Optical threshold as a function of temperature

作者: K. Lefki , P. Muret

DOI: 10.1063/1.354939

关键词:

摘要: Investigation of the photoelectric properties several metal/β‐FeSi2/Si heterostructures is presented. For thin silicide samples (200 A), photocurrent follows a Fowler’s law with threshold Φ1 lower than band gap Eg. thicker (2500 behavior different because optical absorption within can no longer be neglected: maximum observed instead at The variations Eg and temperature are compellingly similar show strong effect electron‐phonon coupling. We suggest that corresponds to transitions between trap localized near heterojunction conduction band.

参考文章(17)
N. E. Christensen, Electronic structure of beta -FeSi2. Physical Review B. ,vol. 42, pp. 7148- 7153 ,(1990) , 10.1103/PHYSREVB.42.7148
J Szczyrbowski, Determination of optical constants of real thin films Journal of Physics D. ,vol. 11, pp. 583- 593 ,(1978) , 10.1088/0022-3727/11/4/021
H. B. DeVore, Spectral Distribution of Photoconductivity Physical Review. ,vol. 102, pp. 86- 91 ,(1956) , 10.1103/PHYSREV.102.86
Evan O. Kane, Theory of Photoelectric Emission from Semiconductors Physical Review. ,vol. 127, pp. 131- 141 ,(1962) , 10.1103/PHYSREV.127.131
J. Derrien, J. Chevrier, V. Le Thanh, J.E. Mahan, Semiconducting silicide-silicon heterostructures : growth, properties and applications Applied Surface Science. pp. 382- 393 ,(1992) , 10.1016/0169-4332(92)90259-Z
N. Cherief, C. D’Anterroches, R. C. Cinti, T. A. Nguyen Tan, J. Derrien, Semiconducting silicide‐silicon heterojunction elaboration by solid phase epitaxy Applied Physics Letters. ,vol. 55, pp. 1671- 1673 ,(1989) , 10.1063/1.102313
C. A. Dimitriadis, J. H. Werner, S. Logothetidis, M. Stutzmann, J. Weber, R. Nesper, Electronic properties of semiconducting FeSi2 films Journal of Applied Physics. ,vol. 68, pp. 1726- 1734 ,(1990) , 10.1063/1.346601
K. P. O’Donnell, X. Chen, Temperature dependence of semiconductor band gaps Applied Physics Letters. ,vol. 58, pp. 2924- 2926 ,(1991) , 10.1063/1.104723
K. Lefki, P. Muret, N. Cherief, R. C. Cinti, Optical and electrical characterization of β‐FeSi2 epitaxial thin films on silicon substrates Journal of Applied Physics. ,vol. 69, pp. 352- 357 ,(1991) , 10.1063/1.347720