作者: Thomas Dienel , Shigeki Kawai , Hajo Söde , Xinliang Feng , Klaus Müllen
DOI: 10.1021/ACS.NANOLETT.5B01403
关键词:
摘要: We report on the structural characterization of junctions between atomically well-defined graphene nanoribbons (GNRs) by means low-temperature, noncontact scanning probe microscopy. show that combination simultaneously acquired frequency shift and tunneling current maps with tight binding (TB) simulations allows a comprehensive atomic connectivity in GNR junctions. The proposed approach can be generally applied to investigation nanomaterials their interconnections is thus expected become an important tool development graphene-based circuitry.