Adhesion of voids to bimetal interfaces with non-uniform energies.

摘要: Interface engineering has become an important strategy for designing radiation-resistant materials. Critical to its success is fundamental understanding of the interactions between interfaces and radiation-induced defects, such as voids. Using transmission electron microscopy, here we report interesting phenomenon in their interaction, wherein voids adhere only one side bimetal rather than overlapping them. We show that this asymmetrical void-interface interaction a consequence differing surface energies two metals non-uniformity interface formation energy. Specifically, grow within phase lower energy wet high-interface regions. Furthermore, because outcome cannot be accounted by wetting with uniform internal energy, our provides experimental evidence contain non-uniform distributions. This work also indicates design irradiation-resistant materials, can avoid overlap via tuning configurations interfaces.