作者: M Haller
DOI: 10.1016/S0736-5845(02)00078-9
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摘要: Abstract Aggressive capacity ramp rate of a semiconductor wafer fabrication is vital for the commercial success enterprise. Basic requirements are short and stable production cycle times to timely qualify equipment provide acceptable yield. Therefore, in ramp-up environment which characterized by high variability uncertainty, an adequate methodology required properly manage conflict fast throughput increase. This paper presents time closely monitoring limiting work process (WIP), means so-called “WIP caps”. Used consequently, this allows accelerate as soon factory performance enables while keeping under control.