Analysis of a Simple Debugging Model.

作者: Adrian E. Raftery

DOI: 10.2307/2347490

关键词:

摘要: Abstract : A system has an unknown number of faults. Each fault causes a failure the system, and is then located removed. The times are independent exponential random variables with common mean. Bayesian analysis this model presented, emphasis on situation where vague prior knowledge represented by limiting, improper, forms. This provides test for reliability growth estimates faults, evaluation current reliability, prediction time to full debugging. Three examples given. Keywords: Bayes factor; Improper prior; Non-homogeneous Poisson process; Reliability growth; Software reliability.

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