摘要: Understanding the suppression of ferroelectricity in perovskite thin films is a fundamental issue that has remained unresolved for decades. We report synchrotron x-ray study lead titanate as function temperature and film thickness single unit cell. At room temperature, ferroelectric phase stable thicknesses down to 3 cells (1.2 nanometers). Our results imply no limit imposed on practical devices by an intrinsic size effect.