作者: Klaus Ehrmann , Fabian Conrad , Ravi Chandra Bakaraju
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摘要: A method for assessing the similarity between a power profile of manufactured optic device and nominal upon which is based. The comprises measuring device, identifying region interest from measured applying an offset to substantially minimize statistical quantifier quantifying profile. further comparing predefined quality control metrics, determining whether meets metrics based, at least in part on comparison. In exemplary embodiments, may comprise associate with another profile, if does not meet metrics.