Stereological relationship between trace length and size distribution of elliptical discontinuities

作者: Lianyang Zhang , HH Einstein , WS Dershowitz , None

DOI: 10.1680/GEOT.2002.52.6.419

关键词:

摘要: This paper presents an approach for estimating the size distributions of elliptical discontinuities. is extension approaches circular By assuming shape and changing aspect ratio k ellipses (i.e. major to minor axes), many real discontinuities can be reasonably represented. For discontinuities, a general stereological relationship between trace length discontinuity (expressed by axis length, a, ellipse) derived area (or window) sampling. From this relationship, expressions are mean (μa) standard deviation (σa) size, (μl) (σl) l, respectively log-normal, negative exponential gamma sizes. Using expressions, effect sampling plane orientation on lengths invest...

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