Application of the linear regression method for comparison of crystallographic textures
作者： J. Tarasiuk , K. Wierzbanowski
DOI: 10.1080/01418619608243705
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摘要: Abstract A new method for the comparison of two crystallographic textures is developed and tested. The based on linear regression procedure. We compare it with other methods show its advantages. may be applied pole figures or orientation distribution functions. It has advantages when unnormalized uncorrected are compared. especially useful ‘on-line’ measurements, incomplete diffraction data calculated measured textures.
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