作者: Min-Seung Choi , Young-Ju Lee , Jung-Dae Kwon , Yongsoo Jeong , Ju-Yun Park
DOI: 10.1016/J.CAP.2013.06.023
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摘要: Abstract We investigated the effects of hydrogen plasma treatment on physical and electrical properties fluorine-doped tin oxide (FTO) films used for amorphous silicon (a-Si) thin film solar cells. A slight increase in carrier concentration by doping effect was observed FTO exposed to 5 min. For further exposure plasma, chemical reduction became prominent resulted deterioration optical film. XPS analysis revealed that SnO2 Sn metallic state occurs surface region. It found defects formed act as recombination centers at interface between electrode p-layer a-Si This phenomenon cell performance. The averaged conversion efficiency (6.82%) cells pristine substrate decreased 5.81% treated 5 min, which is mainly attributed decrease short-circuit current density.