In situ Near-Ambient Pressure X-ray Photoelectron Spectroscopy Reveals the Influence of Photon Flux and Water on the Stability of Halide Perovskite.

作者: M. Kot , L. Kegelmann , H. Köbler , M. Vorokhta , C. Escudero

DOI: 10.1002/CSSC.202001527

关键词:

摘要: For several years, scientists have been trying to understand the mechanisms that reduce long-term stability of perovskite solar cells. In this work, we examined effect water and photon flux on CH3 NH3 PbI3 films cells using in situ near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS), field emission scanning electron microscopy (FESEM), current density-voltage (J-V) characterization. The used amount vapor (up 1 mbar) had a negligible impact film. higher flux, more prominent were changes in NAP-XPS FESEM data; also, faster decline power conversion efficiency (PCE) substantial hysteresis J-V characteristics observed. Based our results, it can be concluded PCE decrease originates from creation Frenkel pair defects film under illumination. stronger illumination, number defects, leading sweeps.

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