Electro-emissive laser stimulated test

摘要: A test arrangement for printed wiring boards or the like employs a scanned laser beam which impinges upon photoemissive grid mounted close to board under test. The causes locally emit electrons are attracted toward due an electric field between and conductive plane behind board. spacing workpiece is very small so electron localized travels short distance; there no need deflecting beam, because it scanned. charge transferred from part by flow detected correlated with position of provide indication status pattern. Undesired shorts open circuit conditions among conductors on determined comparing transfer as function desired standard pattern produced fault-free