Trapping Effects in Drift Mobility Experiments

作者: Wayne E. Tefft

DOI: 10.1063/1.1709312

关键词:

摘要: Theoretical expressions have been derived for the charge‐distribution function and resultant voltage‐decay curve applicable to drift mobility experiments in presence of traps. The was obtained under assumption constant electric field neglect recombination diffusion. results are, therefore, limited case low carrier densities.The general expression is quite complicated, but useful approximations are made various time regions. In addition, it shown how theory may be applied xerographic discharge mode certain conditions.

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