作者: Yong Yee Lim , M Munawar Chaudhri
DOI: 10.1088/0022-3727/34/13/102
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摘要: An atomic force microscopy study of relatively large residual Berkovich, Vickers and spherical nano indentations in four metals two ceramics (high-temperature superconductor YBCO polycrystalline silicon nitride) is described. It shown that these materials, which are free from extensive cracking, change temperature environmental attack, do not show any measurable relaxation even over a period up to years. This fact, combined with our previous continuous situ observations indentation experiments on MgO single crystals, indicates careful detailed investigations metrological microscopes can be carried out, without there being risk relaxation, either their dimensions or profiles, well after the have been made.