Wireless radio frequency technique design and method for testing of integrated circuits and wafers
作者： Brian Moore
DOI:
关键词:
摘要: The present invention is for an apparatus and method the wireless testing of Integrated Circuits wafers. comprises a test unit external from wafer at least one circuit which fabricated on contains Circuit. transmits RF signal to power circuit. circuit, comprising variable ring oscillator, performs series parametric tests normal operating frequency Circuit results analysis.
google.com.mx 参考文章(82)
Andres Bryant, Minh Ho Tong, Edward J. Nowak, Method and apparatus for monitoring SOI hysterises effects ,(1999)
Thomas A Kriofsky, Leon M Kaplan, Inductively coupled passive responder and interrogator unit having multidimension electromagnetic field capabilities ,(1970)
Robert O. Conn, Method for characterizing interconnect timing characteristics ,(1998)
John J. Zasio, Delay testing method for CMOS LSI and VLSI integrated circuits ,(1984)
Robert N. Deming, David W. Hedges, William C. Terrell, Ira Deyhimy, Method and apparatus for controlling clock skew ,(1991)
Mark H. McLeod, Test circuit for delay measurements on a LSI chip ,(1980)
Andrew G. F. Dingwall, Voltage controlled oscillator (VCO) employing nested oscillating loops ,(1977)
Chia-Chi Chao, James Euisik Yoon, Norman Kung-Po Yeung, Edward Tonguk Pak, Apparatus and method for determining the speed of a semiconductor chip ,(1996)
Christopher Alan Dums, Fred Schleifer, John Drinkard, System and method for delay line testing ,(2002)