作者: Louanes Hamzioui , Fares Kahoul , Ahmed Boutarfaia
DOI: 10.1016/J.EGYPRO.2014.06.015
关键词:
摘要: The effect of phosphorus additions on the structure, microstructure and dielectrics properties Pb0.98Ca0.02[(Zr0.52Ti0.48)0,98(Cr3+0.5, Ta5+0.5)0,02]1-xPx O3 (x ranged from 0.01 to 0.12) ceramics have been investigated. All samples were prepared by a high-temperature solid-state reaction technique. AFM analysis compounds suggests that average grain size increases with increasing sintering temperature which is characteristic ceramic material. Until it reaches maximum values for simple doped 4 Wt. % P2O5 at 1050 °C. Dielectric studies as function frequency (from 1 200 KHz) sintered different temperatures (1000, 1050, 1100, 1150 1180° C) show undergo phase transition diffuse type. shifts towards higher side increase in typical relaxor