Vanadium oxide thin films for optical readout-based thermal imager
作者： A.A. Odebowale , M. Abdel-Rahman , H. Albrithen
DOI: 10.1016/J.IJLEO.2019.163580
关键词:
摘要: Abstract In this study, optical characterization of vanadium oxide (VOx) thin film is performed using a variable angle spectroscopic ellipsometer (VASE). The at four different room temperatures, 25.5–28.5 °C, in steps 1 °C. best fitting results the ellipsometric parameters φ and Δ are obtained by GenOsc layer with Lorentz oscillator. Four thermo-optic coefficients (TOCs) from modelled data. TOC value least extinction coefficient chosen, which occurs 26.5 °C. effect on shifting Fabry-Perot cavity filter (FPCF) tuning frequency examined all designs (2, 4, 6 stacks) to determine sensitivity FPCF sensor scene temperature variations. We verify performance as long-wave infrared radiation absorber visible light band-pass filter. This designed have low thermal conductivity mechanical stress.
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