Surface structure reflectometry with x-rays.
作者： Sunil K Sinha
DOI: 10.1016/S1359-0286(96)80046-5
关键词:
摘要: Abstract X-ray surface scattering is rapidly emerging as a popular technique for rapid in situ nondestructive characterization of surfaces and interfaces. Applications have been very widespread ranged from studies film growth morphology to molecular ordering at solid/liquid free fluid There has also increased emphasis on the analysis off-specular characterize interface roughness morphology.
osti.gov
elsevier.com
sci-hub.se 参考文章(95)
J. X. Wang, G. M. Watson, B. M. Ocko, Ordered Binary Ionic Adlayers on a Au(110) Electrode: Coadsorption of Alkali Metal Cations with Iodide Anions The Journal of Physical Chemistry. ,vol. 100, pp. 6672- 6677 ,(1996) , 10.1021/JP952938Y
X. Z. Wu, B. M. Ocko, H. Tang, E. B. Sirota, S. K. Sinha, M. Deutsch, Surface freezing in binary mixtures of alkanes: New phases and phase transitions Physical Review Letters. ,vol. 75, pp. 1332- 1335 ,(1995) , 10.1103/PHYSREVLETT.75.1332
V. M. Kaganer, S. A. Stepanov, R. Köhler, Bragg diffraction peaks in x-ray diffuse scattering from multilayers with rough interfaces. Physical Review B. ,vol. 52, pp. 16369- 16372 ,(1995) , 10.1103/PHYSREVB.52.16369
H. Dosch, A. Lied, J.H. Bilgram, Glancing-angle X-ray scattering studies of the premelting of ice surfaces Surface Science. ,vol. 327, pp. 145- 164 ,(1995) , 10.1016/0039-6028(94)00801-9
Jun Li, K. S. Liang, N. Camillone, T. Y. B. Leung, G. Scoles, The structure of n‐octadecane thiol monolayers self‐assembled on Au(001) studied by synchrotron x‐ray and helium atom diffraction Journal of Chemical Physics. ,vol. 102, pp. 5012- 5028 ,(1995) , 10.1063/1.469551
M. Rauscher, T. Salditt, H. Spohn, Small-angle x-ray scattering under grazing incidence: The cross section in the distorted-wave Born approximation Physical Review B. ,vol. 52, pp. 16855- 16863 ,(1995) , 10.1103/PHYSREVB.52.16855
S. Dietrich, A. Haase, Scattering of X-rays and neutrons at interfaces Physics Reports. ,vol. 260, pp. 1- 138 ,(1995) , 10.1016/0370-1573(95)00006-3
C. A. Melendres, Y. P. Feng, D. D. Lee, S. K. Sinha, X‐Ray Diffuse Scattering for the In Situ Study of Electrochemically Induced Pitting on Metal Surfaces Journal of The Electrochemical Society. ,vol. 142, ,(1995) , 10.1149/1.2043974
Yoshio Okahata, Takuya Kobayashi, Kentaro Tanaka, Orientation of DNA Double Strands in a Langmuir−Blodgett Film Langmuir. ,vol. 12, pp. 1326- 1330 ,(1996) , 10.1021/LA950529N
H.L. Meyerheim, S. Pflanz, R. Schuster, I.K. Robinson, Surface X-ray diffraction on the potassium-induced reconstruction of the Ag(001) surface Physica B: Condensed Matter. ,vol. 221, pp. 134- 140 ,(1996) , 10.1016/0921-4526(95)00915-9