X-Ray and Shubnikov-De Haas Studies of C8n AsF5(n= 1,2,3)
作者： R. S. Markiewicz , J. S. Kasper , H. R. Hart , L. V. Interrante
DOI: 10.1007/978-3-642-81774-8_18
关键词:
摘要: (0,0,l)-X-ray-reflection studies of single crystal and HOPG graphites intercalated with AsF5 have provided maps the c-axis charge density distribution these intercalates. Analysis this allows an estimate ratio AsF6 -:AsF5 in intercalant layers. This turn yields transfer f (how far reaction 3 + 2 e- → - AsF3 has proceded to right). Presence significant shows that stage 2, ≃ 0.4 − 0.45, considerably below maximum value 2/3.
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