DOI: 10.1016/1359-0189(93)90198-I
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摘要: Abstract A new MacintoshTM-controlled microscope stage and digitizing tablet system has been developed that automates external detector method grain-to-mica matching, track length measurement, slide scanning, object centering, file management within a single, well-integrated, user-friendly program environment. The is based on high-quality KinetekTM aumated sanning found wide use in the microelectronics industry. unique feature of cursor to control most actions, resulting very intuitive natural mode operation, faster less tedious analysis samples than with other automated systems.