Crystal rotation in Cu single crystal micropillars: In situ Laue and electron backscatter diffraction
作者： R. Maaß , S. Van Petegem , D. Grolimund , H. Van Swygenhoven , D. Kiener
DOI: 10.1063/1.2884688
关键词:
摘要: In situ microdiffraction experiments were conducted on focused ion beam machined single crystal Cu pillars oriented for double slip. During deformation, the undergoes lattice rotation both primary and critical slip system. spite of initial homogeneous microstructure pillar, sets in already at yield is more important top pillar than bottom, demonstrating inhomogeneous stress state during a microcompression experiment. The results are confirmed by electron backscatter diffraction measurements.
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