Symmetric curvature descriptors for label-free analysis of DNA

摘要: High-resolution microscopy techniques such as electron microscopy, scanning tunnelling and atomic force represent well-established, powerful tools for the structural characterization of adsorbed DNA molecules at nanoscale. Notably, analysis contours allows mapping intrinsic curvature flexibility along molecular backbone. This is particularly suited to address impact base-pairs sequence on local conformation strands plays a pivotal role investigations relating inherent shape other functional properties. Here, we introduce novel chain descriptors aimed characterize with unknown orientation. They consist stochastic functions that couple curvatures two nanosized segments, symmetrically placed contour. We show fine ensemble-averaged backbone generates characteristic patterns variation highlight all pairs tracts large or enhanced flexibility. demonstrate practical applicability method chains imaged by microscopy. Our approach paves way label-free comparative duplexes, detect nanoscale conformational changes physical biological relevance in sample numbers.