Using electron beams to investigate carbonaceous materials
作者： Clemens Mangler , Jannik C. Meyer
DOI: 10.1016/J.CRHY.2013.10.011
关键词:
摘要: Abstract This paper provides a brief review on electron microscopic studies of carbon materials. We discuss all aspects ranging from sample preparation via basics the structure and its reciprocal space representation to high-resolution imaging spectroscopy. Emphasis is given recent developments, namely aberration-corrected microscopy newest low-dimensional allotrope, graphene.
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