A multi-detector, digitizer based neutron depth profiling device for characterizing thin film materials.
作者： P. L. Mulligan , L. R. Cao , D. Turkoglu
DOI: 10.1063/1.4732168
关键词:
摘要: Neutron depth profiling (NDP) is a mature, nondestructive technique used to characterize the concentration of certain light isotopes in material as function by measuring residual energy charged particles neutron induced reactions. Historically, NDP has been performed using single detector, resulting low intrinsic detection efficiency, and limiting largely high flux research reactors. In this work, we describe new instrument design with higher efficiency way spectrum summing across multiple detectors. Such capable acquiring statistically significant particle at facilities limited operation time.
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