摘要: In close analogy to the structural refinement provided by Rietveld method, Whole Powder Pattern Modelling (WPPM) is proposed as a general technique for microstructure refinement. WPPM consists in simultaneous modelling of all peak profiles diffraction pattern from (single or multi-phase) polycrystalline materials, without using arbitrary profile functions. The entire modelled directly terms physical parameters describing main microstructural features influencing width, shape and position, also considering instrumental effects background.
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