Measurement of thermo-optic properties of thin film dielectric coatings
作者： Gregory H. Ogin
DOI: 10.7907/A1CR-G214.
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摘要: We have carried out an experiment to test the theory of thermo-optic response a dielectric stack mirror coating and measure parameters interest in calculating noise. Specifically, we measured coefficient thermal expansion change index refraction with temperature (dn/dT ) for thin film silica (SiO2) tantala (Ta2O5) coatings. These measurements were achieved by driving fluctuations such mirrors one arm small Michelson interferometer. report on results that along its potential implications future gravitational wave detectors, suggest next steps this important line investigation.
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