An X-ray scatter system for material identification in cluttered objects: A Monte Carlo simulation study

摘要: Abstract The analysis of X-ray scatter patterns has been demonstrated as an effective method identifying specific materials in mixed object environments, for both biological and non-biological applications. Here we describe imaging system material identification cluttered objects investigate its performance using a large-scale Monte Carlo simulation study one-thousand containing broad array materials. Geant4 source code Rayleigh physics was modified to model coherent diffraction bulk based on experimentally measured form factors 33 then used signals from variety targets clutter (background) one thousand randomized objects. resulting images were characterize four parameters the that affected ability identify target materials: (a) arrangement object, (b) attenuation, (c) type material, (d) tube current. We found positioning within did not significantly affect their detectability; however, strong negative correlation observed between detectability attenuation object. signal also be relatively invariant increases current above 1 mAs most considered study. This work is first our knowledge large population lays foundation studies effectiveness systems complex samples.