Synthesis and dielectric relaxation behavior of 55B2O3–15SiO2– 30Na2O: WO3 glass system

摘要: Abstract 55 B2O3 – 15 SiO2 30 Na2O: x WO3, (x ranging from 0 to 5 wt%) glass composites were prepared according the melt-quenching procedure. The samples characterized via X-ray diffraction and broad band dielectric spectroscopy (viz., constant (e1), tanδ AC conductivity (σAC) over a wide range of frequency temperature). No sharp peaks shown in XRD pattern is evidence amorphous nature samples. It turns out that values e1 e2 are increasing at higher temperatures particularly lower frequencies. energy barrier height, WM decreased as 0.27, 0.25 0.22 while showed value 0.29 eV for 5.0 wt% WO3. In modulus plots, two relaxation processes found especially on temperature side. also shifted with temperature. exponent s have been lie between 0.48 0.74, which confirms conduction mechanism follows correlated hopping model. By calculating activation associated DC conductivity, it was close, indicates same charges contribute processes.