Spectroscopic ellipsometry study of Pb1−xEuxSe(0⩽x⩽0.45)

摘要: We have measured the complex dielectric function, e(E)=e1(E)+ie2(E), of Pb1−xEuxSe in 1.2–5.0 eV photon-energy range by spectroscopic ellipsometry at room temperature. The crystals were grown conventional Bridgman method (x=0) and hot-wall epitaxy on (111) BaF2 substrates 300 °C (0.09⩽x⩽0.45). e(E) data revealed distinct structures two critical-point (CP) energies, E1 E2. second-derivative spectra d2e(E)/dE2, analyzed using a theoretical model called function. CP parameters, such as energy, amplitude, broadening, function alloy composition x fit determined from these derivative analyses. This parameterization parameters enabled us to calculate its related optical constants for optional photon energy.